Manufacture and Calibration
- SiC is a robust, temperature resistant material that is well studied
- During the manufacture process many specialized point defects are created, which can be annealed with exposure to temperature over time
- Thousands of well controlled experiments are conducted to create a calibration nomogram relating changes in the crystal latice with temperature and time.
Test Planning and Execution
- Typical installation embeds the UCTS in a tiny cavity within the test article, hidden from the chaotic and harsh influences of the flow path.
- Throughout the duration of testing, the defects in the crystalline structure are annihilated as a function of temperature and time.
- UCTS are then removed and returned to LGTL Global for analysis along with a normalized time history of the test.
Analysis and Data Reduction
- Max temperature experienced during the test is determined using x-ray diffractometer measurements, the calibration nomogram, and a reference time history of the test.
- A thorough thermal mapping can be achieved with good accuracy. Measurement results are typically used by customers for design verification and model validation purposes.